Equivalent circuits for electromigration

Electromigration in Interconnect Structures of Microelectronics Circuits

We present a comprehensive physical model for the whole life cycles of electromigration induced voids. Special emphasis is put on explaining the void morphology and its impact on interconnect resistance. Investigations for common twoand three-dimensional interconnect structures are presented. Implications of the theoretical analysis and the simulation results for modern interconnect design are ...

Current-Driven Wire Planning for Electromigration Avoidance in Analog Circuits

Electromigration due to insufficient wire width can cause the premature failure of a circuit. The ongoing reduction of circuit feature sizes has aggravated the problem over the last couple of years, especially with analog circuits. It is therefore an important reliability issue to consider current densities already in the physical design stage. We present a new methodology capable of routing an...

Current Conveyor Equivalent Circuits

An equivalence between a class of (current conveyor) CC II+ and CC IIcircuits is established. CC IIequivalent circuit uses one extra element. However, under certain condition, the extra element can be eliminated. As an illustration of the application of this equivalence, minimal first and second order all-pass filters are derived. In certain cases, it is possible to compensate the effect of the...

Electromigration in submicron interconnect features of integrated circuits

Extracting More Accurate FET Equivalent Circuits

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